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CMOS SRAM CIRCUIT DESIGN AND PARAMETRIC TEST IN NANO-SCALED TECHNOLOGIES / by Pavlov Andrei

By: Pavlov Andrei.
Contributor(s): Pavlov Andrei | Sachdev, Manoj.
Material type: materialTypeLabelBookPublisher: New Delhi Springer 2008Description: 193 23cm.ISBN: 9788132202325.DDC classification: 621.38152
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Item type Current location Home library Call number Status Date due Barcode Item holds
Books Books Central Library IIIT Vadodara
Central Library IIIT Vadodara
621.38152 PAV (Browse shelf) Available 001561
Total holds: 0

English

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Central Library, Indian Institute of Information Technology, Vadodara
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